ARTICLE:

• THERMAL CONDUCTANCE OF TWO-SIDED CNT INTERFACES MEASUERED BY A PHOTO ACOUSTIC TECHNIQUE  download article

B. A. Cola
Purdue University School of Mechanical Engineering, and Purdue University Birck Nanotechnology Center, West Lafayette, USA

J. Xu
Purdue University School of Mechanical Engineering, and Purdue University Birck Nanotechnology Center, West Lafayette, USA

C. Cheng
Purdue University School of Mechanical Engineering, and Purdue University Birck Nanotechnology Center, West Lafayette, USA

Xianfan Xu
Mechanical Engineering Department Purdue University, 1288 Mechanical Engineering Building West Lafayette, IN 47907-1288, USA

T. Fisher
School of Mechanical Engineering and Birck Nanotechnology Center Purdue University, West Lafayette, USA

ABSTRACT

This work describes an experimental study of thermal conductance across two-sided, multi-walled carbon nanotube (CNT) array interfaces. A photoacoustic technique is used to measure thermal interface resistance. Well anchored, dense and vertically oriented, multi-walled carbon nanotube arrays have been directly synthesized on silicon wafers and pure copper sheets using plasma-enhanced chemical vapor deposition. With the photoacoustic technique, the small interface resistance values of the highly conductive CNT-CNT interface can be measured with accuracy and precision. A comparison of present results with those from a 1-D reference bar method is presented along with discussion of experimental methods. The thermal contact resistance of the two-sided CNT interface is 4 ± 0.9 mm²K/W at moderate pressure and compares well with the resistance measured with the 1-D reference bar method.

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